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Properties of GaP(001) surfaces chemically treated in NH4OH solution
http://hdl.handle.net/10087/2942
http://hdl.handle.net/10087/2942fd19b531-93ba-478f-a811-0e98edf83867
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
JApplPhys_100_054904.pdf (139.5 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||||
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| 公開日 | 2008-02-29 | |||||||||
| タイトル | ||||||||||
| タイトル | Properties of GaP(001) surfaces chemically treated in NH4OH solution | |||||||||
| 言語 | ||||||||||
| 言語 | eng | |||||||||
| 資源タイプ | ||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||
| 資源タイプ | journal article | |||||||||
| 著者 |
Morota, Hiroaki
× Morota, Hiroaki
× Adachi, Sadao
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| 抄録 | ||||||||||
| 内容記述タイプ | Abstract | |||||||||
| 内容記述 | Chemically cleaned GaP(001) surfaces in 25% NH4OH solution have been studied using\nspectroscopic ellipsometry (SE), ex situ atomic force microscopy (AFM), x-ray photoelectron\nspectroscopy (XPS), and wettability measurement techniques. The SE data clearly indicate that the\nsolution causes removal of the native oxide film immediately upon immersing the sample. The SE\ndata also indicate that when the native oxide film is completely etch removed, the resulting surface\nis still roughened. The estimated roughness thickness is ～1.2 nm, in excellent agreement with the\nAFM rms value (～1.2 nm). The XPS spectra confirm the removal of the native oxide from the GaP\nsurface. The XPS data also suggest a thin oxide overlayer, ～0.3 nm thick, on the etch-cleaned GaP\nsurface. The wettability measurements indicate that the as-degreased surface is hydrophobic, while\nthe NH4OH-cleaned surface is hydrophilic. This result is in direct contrast to those obtained from\nacid cleaned surfaces, which are usually hydrophobic. The origin of hydrophilicity may be singular\nand associated hydroxyl groups bonded on the GaP surface. | |||||||||
| 書誌情報 |
Journal of Applied Physics 巻 100, 号 5, p. 054904-1-054904-6, 発行日 2006-09-01 |
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| ISSN | ||||||||||
| 収録物識別子タイプ | ISSN | |||||||||
| 収録物識別子 | 0021-8979 | |||||||||
| DOI | ||||||||||
| 関連タイプ | isIdenticalTo | |||||||||
| 識別子タイプ | DOI | |||||||||
| 関連識別子 | info:doi/10.1063/1.2337386 | |||||||||
| 権利 | ||||||||||
| 権利情報 | (C)2006 American Institute of Physics | |||||||||
| フォーマット | ||||||||||
| 内容記述タイプ | Other | |||||||||
| 内容記述 | application/pdf | |||||||||
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| 出版タイプ | VoR | |||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||
| 出版者 | ||||||||||
| 出版者 | American Institute of Physics | |||||||||
| 資源タイプ | ||||||||||
| 内容記述タイプ | Other | |||||||||
| 内容記述 | Journal Article | |||||||||
| 異版である | ||||||||||
| 関連タイプ | isVersionOf | |||||||||
| 識別子タイプ | URI | |||||||||
| 関連識別子 | http://jap.aip.org/ | |||||||||
| 更新日 | ||||||||||
| 日付 | 2017-03-27 | |||||||||
| 日付タイプ | Created | |||||||||
